Effective diagnostics through interval unloads in a BIST environment
Proceedings of the 39th annual Design Automation Conference
Diagnostic Techniques for the IBM S/390 600 MHz G5 Microprocessor
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Fault Diagnosis in Scan-Based BIST Using Both Time and Space Information
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Codes
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Combinatorial group testing methods for the BIST diagnosis problem
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Journal of Electronic Testing: Theory and Applications
Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis
IEEE Transactions on Computers
Diagnosing at-speed scan BIST circuits using a low speed and low memory tester
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information
IEICE - Transactions on Information and Systems
S/390 G5 CMOS microprocessor diagnostics
IBM Journal of Research and Development
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