IBM Journal of Research and Development
A half-micron CMOS logic generation
IBM Journal of Research and Development - Special issue: IBM CMOS technology
INFOS '95 Proceedings of the 9th biennial conference on Insulating films on semiconductors
Finding fault with deep-submicron ICs
IEEE Spectrum
Fundamentals of modern VLSI devices
Fundamentals of modern VLSI devices
Diagnosis and characterization of timing-related defects by time-dependent light emission
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Novel optical probing technique for flip chip packaged microprocessors
ITC '98 Proceedings of the 1998 IEEE International Test Conference
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Microelectronic Engineering - Special issue: Proceedings of the 13th biennial conference on insulating films on semiconductors
Optical Contactless Probing: An All-Silicon, Fully Optical Approach
IEEE Design & Test
The good, the bad, and the ugly of silicon debug
Proceedings of the 43rd annual Design Automation Conference
When failure analysis meets side-channel attacks
CHES'10 Proceedings of the 12th international conference on Cryptographic hardware and embedded systems
Simple photonic emission analysis of AES: photonic side channel analysis for the rest of us
CHES'12 Proceedings of the 14th international conference on Cryptographic Hardware and Embedded Systems
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A newly developed optical method for noninvasively measuring the switching activity of operating CMOS integrated circuit chips is described. The method, denoted as picosecond imaging circuit analysis (PICA) can be used to characterize the gate-level performance of such chips and identify the locations and nature of their operational faults. The principles underlying PICA and examples of its use are discussed.