IBM Journal of Research and Development
OPTICAL INTERFEROMETRIC PROBING OF ADVANCED MICROPROCESSORS
ITC '00 Proceedings of the 2000 IEEE International Test Conference
POIROT1: A Logic Fault Diagnosis Tool and Its Applications
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Debug Methodology for the McKinley Processor
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Enabling autonomic behavior in systems software with hot swapping
IBM Systems Journal
The good, the bad, and the ugly of silicon debug
Proceedings of the 43rd annual Design Automation Conference
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Picosecond imaging circuit analysis
IBM Journal of Research and Development
Real-time lossless compression for silicon debug
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
PSTA-based branch and bound approach to the silicon speedpath isolation problem
Proceedings of the 2009 International Conference on Computer-Aided Design
Embedded debug architecture for bypassing blocking bugs during post-silicon validation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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A novel Infra-Red (IR) optical probing technique whichprovides fast and direct access to diffusion (p-n junction)nodes directly through the silicon substrate is described.The optical probing technology allows waveformmeasurements to be obtained directly from internal nodesof a CMOS integrated circuit (IC). These measurementscan be made on C4 (Flip Chip) mounted IC's in stand-alone,MCM or any other package type for which the chipbackside is accessible and the silicon substrate can bethinned. Timing waveforms taken from state of the artIntelmicroprocessors running at core frequencies 400MHzusing this IR probing technique have been obtained and arepresented.