The Attack of the "Holey Shmoos": A Case Study of Advanced DFD and Picosecond Imaging Circuit Analysis (PICA)

Authors:
William Huott;Moyra McManus;Daniel Knebel;Steven Steen;Dennis Manzer;Pia Sanda;Steven Wilson;Yuen Chan;Antonio Pelella;Stanislav Polonsky
Affiliations:
-;-;-;-;-;-;-;-;-;-
Venue:
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Year:
1999

Citing 3
Cited 6

Shmoo Plotting: The Black Art of IC Testing

IEEE Design & Test
Testing the 400-MHz IBM Generation-4 CMOS Chip

Proceedings of the IEEE International Test Conference
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests

Journal of Electronic Testing: Theory and Applications
Debug Methodology for the McKinley Processor

ITC '01 Proceedings of the 2001 IEEE International Test Conference
The good, the bad, and the ugly of silicon debug

Proceedings of the 43rd annual Design Automation Conference
Picosecond imaging circuit analysis

IBM Journal of Research and Development
LReplay: a pending period based deterministic replay scheme

Proceedings of the 37th annual international symposium on Computer architecture
Deterministic Replay Using Global Clock

ACM Transactions on Architecture and Code Optimization (TACO)

Quantified Score

Hi-index	0.00

Visualization

Abstract

This paper will provide a case study of a particularlydifficult debug problem (the Holey Shmoo problem) whichdeveloped while designing the IBM System/390 G6637MHz microprocessor chip. Resolution of this probleminvolved the use of some of today's newest DFD/DFT anddiagnostics techniques. The discussion of the HoleyShmoo problem and its debug will serve to highlight anddemonstrate some of these advanced techniques.