Testing the 400-MHz IBM Generation-4 CMOS Chip

Test of future system-on-chips

Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design

Testing the 500-MHz IBM S/390 Microprocessor

IEEE Design & Test

Estimating the Economic Benefits of DFT

IEEE Design & Test

Instruction-Based Self-Testing of Processor Cores

Journal of Electronic Testing: Theory and Applications

Testing the Enterprise IBM System/390" Multi Processor

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Logic BIST for Large Industrial Designs: Real Issues and Case Studies

ITC '99 Proceedings of the 1999 IEEE International Test Conference

The Attack of the "Holey Shmoos": A Case Study of Advanced DFD and Picosecond Imaging Circuit Analysis (PICA)

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Testability Evaluation of Sequential Designs Incorporating the Multi-Mode Scannable Memory Element

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Multimode scan: Test per clock BIST for IP cores

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Detection of multiple transitions in delay fault test of SPARC64 microprocessor

Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design

DFT timing design methodology for at-speed BIST

ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference

IBM System z9 eFUSE applications and methodology

IBM Journal of Research and Development

System-on-Chip Test Architectures: Nanometer Design for Testability

System-on-Chip Test Architectures: Nanometer Design for Testability