Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip

Authors:
Mary P. Kusko;Bryan J. Robbins;Thomas J. Snethen;Peilin Song;Thomas G. Foote;William V. Huott
Affiliations:
-;-;-;-;-;-
Venue:
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Year:
1998

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Abstract

This paper describes the test tool methodology used forthe IBM S/390 microprocessor. An efficient, effective,and automated process providingcorrect-by-construction test pattern generation, aneffective test pattern set, and diagnostics wererequired. This paper explains the techniques used toaccomplish this along with explaining why the methodwas chosen and how it helped expedite the process.