Logic design principles with emphasis on testable semicustom circuits
Logic design principles with emphasis on testable semicustom circuits
Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
Random testing for stuck-at storage cells in an embedded memory
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Parallel pseudorandom sequences for built-in test
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
The IBM RISC System/6000 processor: hardware overview
IBM Journal of Research and Development
Simple Bounds on Serial Signature Analysis Aliasing for Random Testing
IEEE Transactions on Computers - Special issue on fault-tolerant computing
Parallel Signature Analysis Design with Bounds on Aliasing
IEEE Transactions on Computers
Advanced microprocessor test strategy and methodology
IBM Journal of Research and Development - Special issue: IBM S/390 G3 and G4
Symmetric transparent BIST for RAMs
DATE '99 Proceedings of the conference on Design, automation and test in Europe
A Tutorial on Built-In Self-Test, Part 2: Applications
IEEE Design & Test
Design of Cache Test Hardware on the HP PA8500
IEEE Design & Test
Testing the 500-MHz IBM S/390 Microprocessor
IEEE Design & Test
Efficient Online and Offline Testing of Embedded DRAMs
IEEE Transactions on Computers
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Error Detecting Refreshment for Embedded DRAMs
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
The Implementation of Pseudo-Random Memory Tests on Commercial Memory Testers
ITC '97 Proceedings of the 1997 IEEE International Test Conference
DESIGN OF CACHE TEST HARDWARE ON THE HP PA8500
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Testing The 400-MHz IBM Generation-4 CMOS Chip
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Balancing structured and ad-hoc design for test: testing of the PowerPC 603TMmicroprocessor
ITC'94 Proceedings of the 1994 international conference on Test
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