Parallel pseudorandom sequences for built-in test

Authors:
P. H. Bardell;W. H. McAnney
Affiliations:
International Business Machines Corporation, Poughkeepsie, NY;International Business Machines Corporation, Poughkeepsie, NY
Venue:
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Year:
1984

Citing 2
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Abstract

Parallel pseudorandom sequences for use in built-in test are discussed. Some of the desired properties of such sequences are unique to the two-dimensional nature of these sequences. A conventional LFSR with parallel output is shown to be a poor choice for such a generator. A compact generator that provides sequences with the desired properties is described.