Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Skew-tolerant circuit design
Design of High-Performance Microprocessor Circuits
Design of High-Performance Microprocessor Circuits
The Test Access Port and Boundary-Scan Architecture
The Test Access Port and Boundary-Scan Architecture
Introducing the IA-64 Architecture
IEEE Micro
Control Strategies for Chip-Based DFT/BIST Hardware
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
DFT Strategy for Intel Microprocessors
Proceedings of the IEEE International Test Conference on Test and Design Validity
Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique
Proceedings of the IEEE International Test Conference on Test and Design Validity
Testability Features of AMD-K6TM Microprocessor
Proceedings of the IEEE International Test Conference
Pentium® Pro Processor Design for Test and Debug
Proceedings of the IEEE International Test Conference
Quad DCVS dynamic logic fault modeling and testing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Testability access of the high speed test features in the Alpha 21264 microprocessor
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test methodology for a microprocessor with partial scan
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test Features of the HP PA7100LC Processor
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Design of Cache Test Hardware on the HP PA8500
Proceedings of the IEEE International Test Conference
The Test and Debug Features of the AMD-K7TM Microprocessor
ITC '99 Proceedings of the 1999 IEEE International Test Conference
DFT Advances in Motorola's MPC7400, a PowerPCTM Microprocessor
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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