The Test and Debug Features of the AMD-K7TM Microprocessor

  • Authors:
  • Timothy J. Wood

  • Affiliations:
  • -

  • Venue:
  • ITC '99 Proceedings of the 1999 IEEE International Test Conference
  • Year:
  • 1999

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Abstract

This paper describes the Design-for-Test (DFT) andDesign-for-Debug (DFD) features of the AMD-K7TMmicroprocessor.