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DAC '77 Proceedings of the 14th Design Automation Conference
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ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
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ITC '00 Proceedings of the 2000 IEEE International Test Conference
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Journal of Electronic Testing: Theory and Applications
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This paper describes the Design-for-Test (DFT) andDesign-for-Debug (DFD) features of the AMD-K7TMmicroprocessor.