Conversion of Small Functional Test Sets of Nonscan Blocks to Scan Patterns

Authors:
Don E. Ross;Tim Wood;Grady Giles
Affiliations:
-;-;-
Venue:
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Year:
2000

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Abstract

Testing nonscan blocks of hardware such as smallembedded memories (register files, etc.) can be done usingexisting scan chains due to the atypically small memorysize. FastScan's Macrotest has been developed to solve thisproblem, and the more interesting problem of concisely andaccurately informing the user about the specific hardwareand command constraints which prevent successful testing.This allows the user to quickly identify the particular problems,and add DFT or change the patterns to match thearchitectural and other restraints of the embedding.