Optical beam induced currents in MOS transistors
Microelectronic Engineering - Electron and optical beam testing of integrated circuits
Locating IC defects in process monitors and test structures using optical beam induced current
Microelectronic Engineering - Electron and optical beam testing of integrated circuits
Optical beam testing and its potential for electronic device characterization
Proceedings of the third European conference on Electron and optical testing of electronic devices
CRYPTO '99 Proceedings of the 19th Annual International Cryptology Conference on Advances in Cryptology
ElectroMagnetic Analysis (EMA): Measures and Counter-Measures for Smart Cards
E-SMART '01 Proceedings of the International Conference on Research in Smart Cards: Smart Card Programming and Security
Design and Analysis of Dual-Rail Circuits for Security Applications
IEEE Transactions on Computers
Picosecond imaging circuit analysis
IBM Journal of Research and Development
Using Optical Emission Analysis for Estimating Contribution to Power Analysis
FDTC '09 Proceedings of the 2009 Workshop on Fault Diagnosis and Tolerance in Cryptography
Ways to enhance differential power analysis
ICISC'02 Proceedings of the 5th international conference on Information security and cryptology
Optically enhanced position-locked power analysis
CHES'06 Proceedings of the 8th international conference on Cryptographic Hardware and Embedded Systems
Blind cartography for side channel attacks: cross-correlation cartography
International Journal of Reconfigurable Computing - Special issue on Selected Papers from the International Conference on Reconfigurable Computing and FPGAs (ReConFig'10)
Simple photonic emission analysis of AES: photonic side channel analysis for the rest of us
CHES'12 Proceedings of the 14th international conference on Cryptographic Hardware and Embedded Systems
Differential photonic emission analysis
COSADE'13 Proceedings of the 4th international conference on Constructive Side-Channel Analysis and Secure Design
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The purpose of failure analysis is to locate the source of a defect in order to characterize it, using different techniques (laser stimulation, light emission, electromagnetic emission...). Moreover, the aim of vulnerability analysis, and particularly side-channel analysis, is to observe and collect various leakages information of an integrated circuit (power consumption, electromagnetic emission ...) in order to extract sensitive data. Although these two activities appear to be distincted, they have in common the observation and extraction of information about a circuit behavior. The purpose of this paper is to explain how and why these activities should be combined. Firstly it is shown that the leakage due to the light emitted during normal operation of a CMOS circuit can be used to set up an attack based on the DPA/DEMA technique. Then a second method based on laser stimulation is presented, improving the "traditional" attacks by injecting a photocurrent, which results in a punctual increase of the power consumption of a circuit. These techniques are demonstrated on an FPGA device.