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IBM Journal of Research and Development
IC Failure Analysis: Magic, Mystery, and Science
IEEE Design & Test
Defect level prediction for I_DDQ testing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
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ITC '97 Proceedings of the 1997 IEEE International Test Conference
On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
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