IDDQ Testing in Deep Submicron Integrated Circuits

Authors:
Anthony C. Miller
Affiliations:
-
Venue:
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Year:
1999

Citing 15
Cited 26

IDDQ testing as a component of a test suite: the need for several fault coverage metrics

Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Reliability benefits of IDDQ

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QUIETEST: a methodology for selecting IDDQ test vectors

Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Identifying defects in deep-submicron CMOS ICs

IEEE Spectrum
IDDQ Testing: Issues Present and Future

IEEE Design & Test
IC Failure Analysis: Magic, Mystery, and Science

IEEE Design & Test
IDDQ Characterization in Submicron CMOS

Proceedings of the IEEE International Test Conference
Current Signatures: Application

Proceedings of the IEEE International Test Conference
Pentium® Pro Processor Design for Test and Debug

Proceedings of the IEEE International Test Conference
Estimation of defect-free IDDQ in submicron circuits using switch level simulation

ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test Features of the HP PA7100LC Processor

Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
On the Comparison of IDDQ and IDDQ Testing

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
An Histogram Based Procedure for Current Testing of Active Defects

ITC '99 Proceedings of the 1999 IEEE International Test Conference
Defect classes - an overdue paradigm for CMOS IC testing

ITC'94 Proceedings of the 1994 international conference on Test
Is IDDQ yield loss inevitable?

ITC'94 Proceedings of the 1994 international conference on Test

Modeling and simulation of real defects using fuzzy logic

Proceedings of the 37th Annual Design Automation Conference
Deep Submicron CMOS Current IC Testing: Is There a Future?

IEEE Design & Test
Current-Based Testing for Deep-Submicron VLSIs

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Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits

IEEE Design & Test
Replacing IDDQ Testing: With Variance Reduction

Journal of Electronic Testing: Theory and Applications
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing

Journal of Electronic Testing: Theory and Applications
Divide-and-Conquer IDDQ Testing for Core-based System Chips

ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Precise Test Generation for Resistive Bridging Faults of CMOS Combinational Circuits

ITC '00 Proceedings of the 2000 IEEE International Test Conference
Multiple-Parameter CMOS IC Testing with Increased Sensitivity for IDDQ

ITC '00 Proceedings of the 2000 IEEE International Test Conference
Stuck-Fault Tests vs. Actual Defects

ITC '00 Proceedings of the 2000 IEEE International Test Conference
Test Method Evaluation Experiments & Data

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An Empirical Study on the Effects of Test Type Ordering on

ITC '00 Proceedings of the 2000 IEEE International Test Conference
Improving Delta-IDDQ-based test methods

ITC '00 Proceedings of the 2000 IEEE International Test Conference
Increasing the IDDQ Test Resolution Using Current Prediction

ITC '00 Proceedings of the 2000 IEEE International Test Conference
DECOUPLE: DEFECT CURRENT DETECTION IN DEEP SUBMICRON IDDQ

ITC '00 Proceedings of the 2000 IEEE International Test Conference
Improved Wafer-level Spatial Analysis for IDDQ Limit Setting

ITC '01 Proceedings of the 2001 IEEE International Test Conference
The Future of Delta IDDQ Testing

ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Practical Built-In Current Sensor for IDDQ Testing

ITC '01 Proceedings of the 2001 IEEE International Test Conference
On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor

IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
On Faster IDDQ Measurements

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Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ

IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
On New Current Signatures and Adaptive Test Technique Combination

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Built-in Current Sensor for "I{DDQ} Testing of Deep Submicron Digital CMOS ICs

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FPGA Bridging Fault Detection and Location via Differential I{DDQ}

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IDDX-based test methods: A survey

ACM Transactions on Design Automation of Electronic Systems (TODAES)
Graphical IDDQ signatures reduce defect level and yield loss

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

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Abstract

The increased background leakage current of deep submicrondevices threatens the practical application of the traditionalIDDQ test.This paper describes a new Delta IDDQ testtechnique which has proven effective at detect defection fordeep submicron memory and logic devices.