IDDQ Characterization in Submicron CMOS

BIFEST: a built-in intermediate fault effect sensing and test generation system for CMOS bridging faults

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Influence of manufacturing variations in IDDQ measurements: a new test criterion

DATE '00 Proceedings of the conference on Design, automation and test in Europe

Estimation of the defective IDDQ caused by shorts in deep-submicron CMOS ICs

Proceedings of the conference on Design, automation and test in Europe

IDDQ Testing of Opens in CMOS SRAMs

Journal of Electronic Testing: Theory and Applications

Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing

Journal of Electronic Testing: Theory and Applications

Studies of the SEMATECH IDDq test data

Journal of Systems Architecture: the EUROMICRO Journal - Defect and fault tolerance in VLSI Systems

Estimation of defect-free IDDQ in submicron circuits using switch level simulation

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Current Ratios: A Self-Scaling Technique for Production IDDQ Testing

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Multiple-Parameter CMOS IC Testing with Increased Sensitivity for IDDQ

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Improving Delta-IDDQ-based test methods

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Intrinsic Leakage in Low Power Deep Submicron CMOS ICs

ITC '97 Proceedings of the 1997 IEEE International Test Conference

A Compact Built-In Current Sensor for IDDQ Testing

IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)

Current Ratios: A Self-Scaling Technique for Production IDDQ Testing

ITC '99 Proceedings of the 1999 IEEE International Test Conference

IDDQ Testing in Deep Submicron Integrated Circuits

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Transient Current Testing of 0.25 µm CMOS Devices

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Defect-Based Delay Testing of Resistive Vias-Contacts A Critical Evaluation

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ

IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power

IDDX-based test methods: A survey

ACM Transactions on Design Automation of Electronic Systems (TODAES)