Correlation analysis of particle clusters on integrated circuit wafers
IBM Journal of Research and Development
IDDQ testing as a component of a test suite: the need for several fault coverage metrics
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Transient power supply current monitoring—a new test method for CMOS VLSI circuits
Journal of Electronic Testing: Theory and Applications
Algorithms to select IDDQ measurement points to detect bridging faults
Journal of Electronic Testing: Theory and Applications
IDDQ testing: state of the art and future trends
Integration, the VLSI Journal - Special issue on VLSI testing
Exploring the combination of IDDQ and iDDt testing: energy testing
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Test challenges in nanometric CMOS technologies
Proceedings of the third session on Reliability in VLSI circuits : operation, manufacturing and design: operation, manufacturing and design
Influence of manufacturing variations in IDDQ measurements: a new test criterion
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
Estimation of the defective IDDQ caused by shorts in deep-submicron CMOS ICs
Proceedings of the conference on Design, automation and test in Europe
Fault models and test generation for IDDQ testing: embedded tutorial
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
Scaling of stack effect and its application for leakage reduction
ISLPED '01 Proceedings of the 2001 international symposium on Low power electronics and design
Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs
ISLPED '01 Proceedings of the 2001 international symposium on Low power electronics and design
Leakage control with efficient use of transistor stacks in single threshold CMOS
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A novel wavelet transform based transient current analysis for fault detection and localization
Proceedings of the 39th annual Design Automation Conference
Test Generation for Current Testing (CMOS ICs)
IEEE Design & Test
Achieving IDDQ/ISSQ Production Testing with QuiC-Mon
IEEE Design & Test
IDDQ Testing: Issues Present and Future
IEEE Design & Test
Deep Submicron CMOS Current IC Testing: Is There a Future?
IEEE Design & Test
Defect-Oriented Testing and Defective-Part-Level Prediction
IEEE Design & Test
Fault Detection and Location Using IDD Waveform Analysis
IEEE Design & Test
IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions
IEEE Design & Test
IDDQ Test: Will It Survive the DSM Challenge?
IEEE Design & Test
Performance Comparison of VLV, ULV, and ECR Tests
Journal of Electronic Testing: Theory and Applications
DFT '97 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems
Increasing Current Testing Resolution
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
The 2nd Order Analysis of IDDQ Test Data
DFT '00 Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
A Speed-Dependent Approach for Delta IDDQ Implementation
DFT '01 Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis
DFT '02 Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Defect Classes - An Overdue Paradigm for CMOS IC
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Neighbor selection for variance reduction in I_DDQ and other parametric data
Proceedings of the IEEE International Test Conference 2001
The future of delta I_DDQ testing
Proceedings of the IEEE International Test Conference 2001
Transient Power Supply Current Testing of Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
On the Effect of ISSQ Testing in Reducing Early Failure Rate
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Digital Integrated Circuit Testing using Transient Signal Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
IDDQ Test: Sensitivity Analysis of Scaling
Proceedings of the IEEE International Test Conference on Test and Design Validity
Burn-in Elimination of a High Volume Microprocessor Using IDDQ
Proceedings of the IEEE International Test Conference on Test and Design Validity
On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Proceedings of the IEEE International Test Conference
Fault Location with Current Monitoring
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
IDDQ Characterization in Submicron CMOS
Proceedings of the IEEE International Test Conference
Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs
Proceedings of the IEEE International Test Conference
iDD Pulse Response Testing Applied to Complex CMOS ICs
Proceedings of the IEEE International Test Conference
Application and Analysis of IDDQ Diagnostic Software
Proceedings of the IEEE International Test Conference
Current Signatures: Application
Proceedings of the IEEE International Test Conference
Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects
Proceedings of the IEEE International Test Conference
Estimation of defect-free IDDQ in submicron circuits using switch level simulation
ITC '98 Proceedings of the 1998 IEEE International Test Conference
The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need?
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
IDDQ Testing in CMOS Digital ASIC's - Putting it All Together
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Toward understanding "Iddq-only" fails
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A Comparison of Stuck-At Fault Coverage and IDDQ Testing on Defect Levels
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
The Cost of Quality: Reducing ASIC Defects with IDDQ At-Speed Testing and Increased Fault Coverage
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
iDD Pulse Response Testing of Analog and Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
CMOS IC reliability indicators and burn-in economics
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Very-Low-Voltage Testing for Weak CMOS Logic ICs
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
A practical built-in current sensor for I_DDQ testing
Proceedings of the IEEE International Test Conference 2001
Detecting delay faults using power supply transient signal analysis
Proceedings of the IEEE International Test Conference 2001
Improved wafer-level spatial analysis for I_DDQ limit setting
Proceedings of the IEEE International Test Conference 2001
Is IDDQ Yield Loss Inevitable?
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Using Fourier Analysis to Enhance IC Testability
Proceedings of the The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Practical application of energy consumption ratio test
Proceedings of the IEEE International Test Conference 2001
A New Light-Based Logic IC Screening Method
DFT '00 Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Replacing IDDQ Testing: With Variance Reduction
Journal of Electronic Testing: Theory and Applications
Subthreshold leakage modeling and reduction techniques
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Is IDDQ testing not applicable for deep submicron VLSI in year 2011?
ATS '00 Proceedings of the 9th Asian Test Symposium
ATS '97 Proceedings of the 6th Asian Test Symposium
IDDQ Defect Detection in Deep Submicron CMOS ICs
ATS '98 Proceedings of the 7th Asian Test Symposium
Synthesis of I/sub DDQ/-testable circuits: integrating built-in current sensors
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Iddq Testing for High Performance CMOS - The Next Ten Years
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Deep Sub-Micron IDDQ Testing: Issues and Solutions
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods
ETW '00 Proceedings of the IEEE European Test Workshop
Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods
ETW '00 Proceedings of the IEEE European Test Workshop
LEAP: An Accurate Defect-Free IDDQ Estimator
ETW '00 Proceedings of the IEEE European Test Workshop
Experimental Results from Iddf Testing
DFT '96 Proceedings of the 1996 Workshop on Defect and Fault-Tolerance in VLSI Systems
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Tutorial: Delay Fault Models and Coverage
VLSID '98 Proceedings of the Eleventh International Conference on VLSI Design: VLSI for Signal Processing
Evaluation of Statistical Outlier Rejection Methods for IDDQ Limit Setting
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Current signatures [VLSI circuit testing]
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A Framework to Minimize Test Escape and Yield Loss during IDDQ Testing: A Case Study
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Delta Iddq for Testing Reliability
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Use of Multiple IDDQ Test Metrics for Outlier Identification
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Multiple-Parameter CMOS IC Testing with Increased Sensitivity for IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Successful Implementation of Structured Testing
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Test Method Evaluation Experiments & Data
ITC '00 Proceedings of the 2000 IEEE International Test Conference
VARIANCE REDUCTION USING WAFER PATTERNS in IddQ DATA
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Increasing the IDDQ Test Resolution Using Current Prediction
ITC '00 Proceedings of the 2000 IEEE International Test Conference
DECOUPLE: DEFECT CURRENT DETECTION IN DEEP SUBMICRON IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Improved IDDQ Testing with Empirical Linear Prediction
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Comparison of IDDQ Testing and Very-Low Voltage Testing
ITC '02 Proceedings of the 2002 IEEE International Test Conference
The Heisenberg Uncertainty of Test
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Parametric Failures in CMOS ICs " A Defect-Based Analysis
ITC '02 Proceedings of the 2002 IEEE International Test Conference
GHz Testing and Its Fuzzy Targets
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Screening MinVDD Outliers Using Feed-Forward Voltage Testing
ITC '02 Proceedings of the 2002 IEEE International Test Conference
The Effectiveness of IDDQ and High Voltage Stress for Burn-in Elimination
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
Standard Cell Library Characterization for Setting Current Limits for IDDQ Testing
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
SHOrt Voltage Elevation (SHOVE) Testing
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
Current Signatures for Production Testing
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
IDDQ '97 Proceedings of the 1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)
IDDQ Testing for Submicron CMOS IC Technology Qualification
IDDQ '97 Proceedings of the 1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)
IDDQ '97 Proceedings of the 1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)
Reliabilty, Test, and IDDQ Measurements
IDDQ '97 Proceedings of the 1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)
Model-Based IDDQ Pass/Fail Limit Setting
IDDQ '98 Proceedings of the IEEE International Workshop on IDDQ Testing
IDDQ Data Analysis Using Current Signature
IDDQ '98 Proceedings of the IEEE International Workshop on IDDQ Testing
The use of IDDQ testing in low stuck-at coverage situations
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
An approach to dynamic power consumption current testing of CMOS ICs
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Detection and location of faults and defects using digital signal processing
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
MINVDD Testing for Weak CMOS ICs
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Eigen-Signatures for Regularity-based IDDQ Testing
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Dynamic Supply Current Testing of Analog Circuits Using Wavelet Transform
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Clustering Based Techniques for IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
An Histogram Based Procedure for Current Testing of Active Defects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IDDQ Testing in Deep Submicron Integrated Circuits
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Defect Detection using Power Supply Transient Signal Analysis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Eliminating the Ouija® Board: Automatic Thresholds and Probabilistic IDDQ Diagnosis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
System performance management for the S/390 parallel enterprise server G5
IBM Journal of Research and Development
IC test using the energy consumption ratio
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Statistical threshold formulation for dynamic Idd test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Leakage power bounds in CMOS digital technologies
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IC Outlier Identification Using Multiple Test Metrics
IEEE Design & Test
Fault detection in switched current circuits using built-in transient current sensors
Journal of Electronic Testing: Theory and Applications
Testable designs of multiple precharged domino circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Consistency-based characterization for IC Trojan detection
Proceedings of the 2009 International Conference on Computer-Aided Design
A unified submodular framework for multimodal IC Trojan detection
IH'10 Proceedings of the 12th international conference on Information hiding
CδIDDQ: improving current-based testing and diagnosis through modified test pattern generation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Estimation of fault-free leakage current using wafer-level spatial information
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor
Journal of Electronic Testing: Theory and Applications
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Supply current measurement-based test is a valuable defect-based test method for semiconductor chips. Both static leakage current (IDDQ) and transient current (IDDT) based tests have the capability of detecting unique defects that improve the fault detection capacity of a test suite. Collectively these test methods are known as IDDX tests. However, due to advances in the semiconductor manufacturing process, the future of these test methods is uncertain. This paper presents a survey of the research reported in the literature to extend the use of IDDX tests to deep sub-micron (DSM) technologies.