On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Go/No-Go testing of VCO modulation RF transceivers through the delayed-RF setup
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Researchers and test engineers challenge IDDQ testing on deep submicron (DSM) devices. We have proposed to test devices with high IDDQ currents at normal operating conditions based on exploiting the regularity of defect-free IDDQ signatures, the IDDQ responses of a circuit on a test vector set. This paper demonstrates the fundamental characteristics of the regularity and proposes a new methodology based on eigen-signatures. Eigen-signatures are unique signatures transformed from IDDQ signatures. The analysis of five eigen-signatures, including enhanced "Delta IDDQ" and "Current Ratios", on a product indicates that: the IDDQ values related to a test vector set have a small variation, whereas, the IDDQ magnitudes have a large variation; and the defect current prediction error of methods focusing the changes between the test vectors is 23 times smaller than the error of methods focusing the IDDQ magnitudes.