Leakage control with efficient use of transistor stacks in single threshold CMOS
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IDDQ Testing: Issues Present and Future
IEEE Design & Test
IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions
IEEE Design & Test
Current Signatures: Application
Proceedings of the IEEE International Test Conference
Estimation of defect-free IDDQ in submicron circuits using switch level simulation
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Unit level predicted yield: a method of identifying high defect density die at wafer sort
Proceedings of the IEEE International Test Conference 2001
Improved wafer-level spatial analysis for I_DDQ limit setting
Proceedings of the IEEE International Test Conference 2001
Multiple-Parameter CMOS IC Testing with Increased Sensitivity for IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
VARIANCE REDUCTION USING WAFER PATTERNS in IddQ DATA
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Clustering Based Techniques for IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
An Histogram Based Procedure for Current Testing of Active Defects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
| Hi-index | 0.00 |
Deep-submicron technologies pose difficultchallenges for IDDQ testing in the future. The lowthreshold voltage used by DSM devicesdecreases the defect resolution of IDDQ. However,because IDDQ is a valuable test method,researchers are working to augment IDDQ with othertest parameters to prolong its effectiveness.