Influence of manufacturing variations in IDDQ measurements: a new test criterion
DATE '00 Proceedings of the conference on Design, automation and test in Europe
On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Diagnosis Method Using ΔIDDQ Probabilistic Signatures: Theory and Results
Journal of Electronic Testing: Theory and Applications
LEAP: An Accurate Defect-Free IDDQ Estimator
Journal of Electronic Testing: Theory and Applications
Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing
Journal of Electronic Testing: Theory and Applications
Studies of the SEMATECH IDDq test data
Journal of Systems Architecture: the EUROMICRO Journal - Defect and fault tolerance in VLSI Systems
Current-Based Testing for Deep-Submicron VLSIs
IEEE Design & Test
IDDQ Test: Will It Survive the DSM Challenge?
IEEE Design & Test
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Toward understanding "Iddq-only" fails
ITC '98 Proceedings of the 1998 IEEE International Test Conference
CMOS IC reliability indicators and burn-in economics
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing
Journal of Electronic Testing: Theory and Applications
LEAP: An Accurate Defect-Free IDDQ Estimator
ETW '00 Proceedings of the IEEE European Test Workshop
Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
A Current Integrator for BIST of Mixed-Signal ICs
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '00 Proceedings of the 2000 IEEE International Test Conference
An Analysis of the Delay Defect Detection Capability of the ECR Test Method
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Multiple-Parameter CMOS IC Testing with Increased Sensitivity for IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A BIST Approach for Very Deep Sub-Micron (VDSM) Defects
ITC '00 Proceedings of the 2000 IEEE International Test Conference
An Empirical Study on the Effects of Test Type Ordering on
ITC '00 Proceedings of the 2000 IEEE International Test Conference
VARIANCE REDUCTION USING WAFER PATTERNS in IddQ DATA
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Increasing the IDDQ Test Resolution Using Current Prediction
ITC '00 Proceedings of the 2000 IEEE International Test Conference
The Future of Delta IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Practical Built-In Current Sensor for IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
APPLICATION AND ANALYSIS OF IDDQ DIAGNOSTIC SOFTWARE
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A Study of Test Quality/Tester Scan Memory Trade-offs Using the SEMATECH Test Methods Data
ITC '99 Proceedings of the 1999 IEEE International Test Conference
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Clustering Based Techniques for IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IDDQ Testing in Deep Submicron Integrated Circuits
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Expediting Ramp-to-Volume Production
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Transient Current Testing of 0.25 µm CMOS Devices
ITC '99 Proceedings of the 1999 IEEE International Test Conference
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Eliminating the Ouija® Board: Automatic Thresholds and Probabilistic IDDQ Diagnosis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
IDDQ data analysis using neighbor current ratios
Journal of Systems Architecture: the EUROMICRO Journal - Special issue: Desing and test of systems on a chip
Journal of Electronic Testing: Theory and Applications
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