Transient power supply current monitoring—a new test method for CMOS VLSI circuits
Journal of Electronic Testing: Theory and Applications
Introduction to IDDQ testing
IC test using the energy consumption ratio
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Deep submicron defect detection with the energy consumption ratio
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
IDDQ Testing: Issues Present and Future
IEEE Design & Test
IDDQ Testing of CMOS Opens: An Experimental Study
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Digital Integrated Circuit Testing using Transient Signal Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
Proceedings of the IEEE International Test Conference
Current Signatures: Application
Proceedings of the IEEE International Test Conference
High volume microprocessor test escapes, an analysis of defects our tests are missing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Iddq Testing for High Performance CMOS - The Next Ten Years
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Deep Sub-Micron IDDQ Testing: Issues and Solutions
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Monitoring power dissipation for fault detection
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
On Detecting Bridges Causing Timing Failures
ICCD '99 Proceedings of the 1999 IEEE International Conference on Computer Design
IDDQ '97 Proceedings of the 1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)
An approach to dynamic power consumption current testing of CMOS ICs
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Detection and location of faults and defects using digital signal processing
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Statistical Threshold Formulation For Dynamic Idd Test
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Crosstalk fault detection by dynamic Idd
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
Performance Comparison of VLV, ULV, and ECR Tests
Journal of Electronic Testing: Theory and Applications
Detecting Delay Faults using Power Supply Transient Signal Analysis
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Practical Application of Energy Consumption Ratio Test
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Graphical IDDQ signatures reduce defect level and yield loss
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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An analysis of the energy consumption ratio (ECR) testmethod, based on simulation study of resistive bridges andresistive opens, is presented. These defect classes comprisea very significant percentage of the defects causing speedfailures. We show: (i) bridges causing delay failures and detectable by the difference method is detected by theECR test method; and (ii) bridges and opens causing delayfailures but not detectable by the difference methodare also detected by the ECR test method. This highlightsa very significant advantage of the ECR test method overtest methods.The underlying reason as to why the ECR test methodis good at detecting delay defects is presented. Based onthat we develop a new test method called the ECR-VDDtest. The usefulness of the new method in detecting delaydefects is validated using simulation results.