Transient power supply current monitoring—a new test method for CMOS VLSI circuits
Journal of Electronic Testing: Theory and Applications
IC test using the energy consumption ratio
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Digital Integrated Circuit Testing using Transient Signal Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Iddq Testing for High Performance CMOS - The Next Ten Years
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Deep Sub-Micron IDDQ Testing: Issues and Solutions
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Monitoring power dissipation for fault detection
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
An approach to dynamic power consumption current testing of CMOS ICs
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Detection and location of faults and defects using digital signal processing
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Statistical Threshold Formulation For Dynamic Idd Test
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Crosstalk fault detection by dynamic Idd
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
An Analysis of the Delay Defect Detection Capability of the ECR Test Method
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Graphical IDDQ signatures reduce defect level and yield loss
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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