Design of ICs applying built-in current testing
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Scaling of MOS technology to submicrometer feature sizes
Analog Integrated Circuits and Signal Processing - Joint special issue on analog VLSI computation
Separate IDDQ testing of signal and bias paths in CMOS ICs for defect diagnosis
Journal of Electronic Testing: Theory and Applications
Test Generation for Current Testing (CMOS ICs)
IEEE Design & Test
Iddq Testing for High Performance CMOS - The Next Ten Years
EDTC '96 Proceedings of the 1996 European conference on Design and Test
IC test using the energy consumption ratio
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Deep submicron defect detection with the energy consumption ratio
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Influence of manufacturing variations in IDDQ measurements: a new test criterion
DATE '00 Proceedings of the conference on Design, automation and test in Europe
IDDQ Testing of Submicron CMOS—by Cooling?
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
Estimation of the defective IDDQ caused by shorts in deep-submicron CMOS ICs
Proceedings of the conference on Design, automation and test in Europe
CMOS Differential and Absolute Thermal Sensors
Journal of Electronic Testing: Theory and Applications
Current-Based Testing for Deep-Submicron VLSIs
IEEE Design & Test
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A DFT Technique for Testing High-Speed Circuits with Arbitrarily Slow Testers
Journal of Electronic Testing: Theory and Applications
Divide-and-Conquer IDDQ Testing for Core-based System Chips
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
An Analysis of the Delay Defect Detection Capability of the ECR Test Method
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Multiple-Parameter CMOS IC Testing with Increased Sensitivity for IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Improved Wafer-level Spatial Analysis for IDDQ Limit Setting
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Intrinsic Leakage in Low Power Deep Submicron CMOS ICs
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A Compact Built-In Current Sensor for IDDQ Testing
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
Transient Current Testing of 0.25 µm CMOS Devices
ITC '99 Proceedings of the 1999 IEEE International Test Conference
A DFT Technique for High Performance Circuit Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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The effectiveness of I/sub DDQ/ testing in deep sub-micron is threatened by the increased transistor sub-threshold leakage current. In this article, we survey possible solutions and propose a deep sub-micron I/sub DDQ/ test mode. The methodology provides means for unambiguous measurements of I/sub DDQ/ components and defect diagnosis. The effectiveness of the test mode is demonstrated with a real life example.