On the Development of Analogue Sampled-Data Signal Processing
Analog Integrated Circuits and Signal Processing
Current-Based Testing for Deep-Submicron VLSIs
IEEE Design & Test
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Deep Sub-Micron IDDQ Testing: Issues and Solutions
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Intrinsic Leakage in Low Power Deep Submicron CMOS ICs
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IDDQ Characterization in Submicron CMOS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Mismatch-Induced Trade-Offs and Scalability of Analog Preprocessing Visual Microprocessor Chips
Analog Integrated Circuits and Signal Processing
Transient Current Testing of 0.25 µm CMOS Devices
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Nanometer scale technologies: device considerations
Nano, quantum and molecular computing
A MOS transistor model for mixed analog-digital circuit design and simulation
Design of system on a chip
Techniques for Design and Implementation of Secure Reconfigurable PUFs
ACM Transactions on Reconfigurable Technology and Systems (TRETS)
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