A cell-based power estimation in CMOS combinational circuits
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Transient power supply current monitoring—a new test method for CMOS VLSI circuits
Journal of Electronic Testing: Theory and Applications
Simulation and Generation of IDDQ Tests for Bridging Faults in Combinational Circuits
IEEE Transactions on Computers
Digital Integrated Circuit Testing using Transient Signal Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Iddq Testing for High Performance CMOS - The Next Ten Years
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Deep Sub-Micron IDDQ Testing: Issues and Solutions
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Monitoring power dissipation for fault detection
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
An Efficient IDDQ Test Generation Scheme for Bridging Faults in CMOS Digital Circuits
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
IDDQ '97 Proceedings of the 1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)
Detecting Bridging Faults in Dynamic CMOS Circuits
IDDQ '97 Proceedings of the 1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)
An approach to dynamic power consumption current testing of CMOS ICs
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Deep submicron defect detection with the energy consumption ratio
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Improving bus test via IDDT and boundary scan
Proceedings of the 38th annual Design Automation Conference
Crosstalk fault detection by dynamic Idd
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
An Analysis of the Delay Defect Detection Capability of the ECR Test Method
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Statistical Threshold Formulation For Dynamic Idd Test
ITC '99 Proceedings of the 1999 IEEE International Test Conference
A novel wavelet transform-based transient current analysis for fault detection and localization
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Scaling of iDDT Test Methods for Random Logic Circuits
Journal of Electronic Testing: Theory and Applications
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