Monitoring Power Dissipation for Fault Detection
Journal of Electronic Testing: Theory and Applications
IDDT Testing versus IDDQ Testing
Journal of Electronic Testing: Theory and Applications
On-chip transient current monitor for testing of low-voltage CMOS IC
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Exploring the combination of IDDQ and iDDt testing: energy testing
DATE '99 Proceedings of the conference on Design, automation and test in Europe
IC test using the energy consumption ratio
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Deep submicron defect detection with the energy consumption ratio
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Experimental Results on BIC Sensors for Transient Current Testing
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Crosstalk fault detection by dynamic Idd
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Power supply current detectability of SRAM defects
ATS '95 Proceedings of the 4th Asian Test Symposium
An Analysis of the Delay Defect Detection Capability of the ECR Test Method
ITC '00 Proceedings of the 2000 IEEE International Test Conference
IDD Pulse Response Testing Applied to Complex CMOS ICs
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IDDT: fundamentals and test generation
Journal of Computer Science and Technology
Statistical Threshold Formulation For Dynamic Idd Test
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks
Journal of Electronic Testing: Theory and Applications
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Scaling of iDDT Test Methods for Random Logic Circuits
Journal of Electronic Testing: Theory and Applications
DPA on faulty cryptographic hardware and countermeasures
FDTC'06 Proceedings of the Third international conference on Fault Diagnosis and Tolerance in Cryptography
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