On-chip transient current monitor for testing of low-voltage CMOS IC

Authors:
V. Stopjaková;H. Manhaeve;M. Sidiropulos
Affiliations:
Department of Microelectronics, Slovak Technical University, Slovakia;Department of Microelectronics, KHBO, Belgium;Department of Microelectronics, TU of Brno, Czech Republic
Venue:
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Year:
1999

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