Transient power supply current monitoring—a new test method for CMOS VLSI circuits
Journal of Electronic Testing: Theory and Applications
On-chip transient current monitor for testing of low-voltage CMOS IC
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Neural Networks: A Comprehensive Foundation
Neural Networks: A Comprehensive Foundation
An Introduction to Neural and Electronic Networks
An Introduction to Neural and Electronic Networks
iDD Pulse Response Testing Applied to Complex CMOS ICs
Proceedings of the IEEE International Test Conference
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DAC '83 Proceedings of the 20th Design Automation Conference
On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks
ATS '01 Proceedings of the 10th Asian Test Symposium
Defect Detection using Power Supply Transient Signal Analysis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Transient Current Testing of 0.25 µm CMOS Devices
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Wavelet based fault detection in analog VLSI circuits using neural networks
Applied Soft Computing
A fuzzy classification approach for analog fault diagnosis applying immune algorithm
FSKD'09 Proceedings of the 6th international conference on Fuzzy systems and knowledge discovery - Volume 3
A SVDD approach of fuzzy classification for analog circuit fault diagnosis with FWT as preprocessor
Expert Systems with Applications: An International Journal
Wavelet Neural Network Approach for Testing of Switched-Current Circuits
Journal of Electronic Testing: Theory and Applications
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The paper presents a test stimulus generation and fault simulation methodology for the detection of catastrophic faults in analog circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evaluated ...