iDD Pulse Response Testing Applied to Complex CMOS ICs

• Authors:

• J. S. Beasley;S. Pour-Mozafari;D. Huggett;Alan W. Righter;C. J. Apodaca

• Affiliations:

• -;-;-;-;-

• Venue:
• Proceedings of the IEEE International Test Conference
• Year:
• 1997