Characterization of CMOS Defects using Transient Signal Analysis
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
IDDQ Testing of CMOS Opens: An Experimental Study
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Transient Power Supply Current Testing of Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Digital Integrated Circuit Testing using Transient Signal Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
Proceedings of the IEEE International Test Conference
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
iDD Pulse Response Testing of Analog and Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Monitoring power dissipation for fault detection
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Detection and location of faults and defects using digital signal processing
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Digital integrated circuit testing using transient signal analysis
Digital integrated circuit testing using transient signal analysis
Dynamic Power Supply Current Testing of CMOS SRAMs
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
IC Diagnosis Using Multiple Supply Pad IDDQs
IEEE Design & Test
Power Pin Testing: Making the Test Coverage Complete
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Power Supply Transient Signal Integration Circuit
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Detecting Delay Faults using Power Supply Transient Signal Analysis
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks
Journal of Electronic Testing: Theory and Applications
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
A Two-Level Power-Grid Model for Transient Current Testing Evaluation
Journal of Electronic Testing: Theory and Applications
Defect Detection Using Quiescent Signal Analysis
Journal of Electronic Testing: Theory and Applications
Scaling of iDDT Test Methods for Random Logic Circuits
Journal of Electronic Testing: Theory and Applications
| Hi-index | 0.00 |
Transient Signal Analysis is a digital device testing methodthat is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an8-bit multiplier are analyzed using both hardware and simulations experiments. The small signal variations generated at these test points are analyzed in both the time andfrequency domain. A simple statistical procedure is presented that captures the variation introduced by defectswhile attenuating those variations introduced by processvariations. The results of the analysis show that it is possible to distinguish between defect-free and defective devicesin both simulations and hardware.