IDDQ Test: Sensitivity Analysis of Scaling
Proceedings of the IEEE International Test Conference on Test and Design Validity
Signature Analysis for IC Diagnosis and Failure Analysis
Proceedings of the IEEE International Test Conference
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Current signatures [VLSI circuit testing]
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Defect Detection using Power Supply Transient Signal Analysis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Journal of Electronic Testing: Theory and Applications
Defect Detection Using Quiescent Signal Analysis
Journal of Electronic Testing: Theory and Applications
Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method
IEEE Design & Test
Characterizing within-die variation from multiple supply port IDDQ measurements
Proceedings of the 2009 International Conference on Computer-Aided Design
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A IDDQ technique is proposed based on an extension of a VDDT-based method called transient signal analysis. The method, called quiescent signal analysis, uses IDDQs measured at multiple supply pins as a means of localizing defects.