Bridging fault detection in FPGA interconnects using IDDQ
FPGA '98 Proceedings of the 1998 ACM/SIGDA sixth international symposium on Field programmable gate arrays
IDDQ Testing of Bridging Faults in Logic Resources of Reconfigurable Field Programmable Gate Arrays
IEEE Transactions on Computers
Influence of manufacturing variations in IDDQ measurements: a new test criterion
DATE '00 Proceedings of the conference on Design, automation and test in Europe
On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Diagnosis Method Using ΔIDDQ Probabilistic Signatures: Theory and Results
Journal of Electronic Testing: Theory and Applications
IDDQ Testing of Submicron CMOS—by Cooling?
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
Estimation of the defective IDDQ caused by shorts in deep-submicron CMOS ICs
Proceedings of the conference on Design, automation and test in Europe
IDDQ Testing of Opens in CMOS SRAMs
Journal of Electronic Testing: Theory and Applications
LEAP: An Accurate Defect-Free IDDQ Estimator
Journal of Electronic Testing: Theory and Applications
Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing
Journal of Electronic Testing: Theory and Applications
CMOS Differential and Absolute Thermal Sensors
Journal of Electronic Testing: Theory and Applications
IC Diagnosis Using Multiple Supply Pad IDDQs
IEEE Design & Test
Current-Based Testing for Deep-Submicron VLSIs
IEEE Design & Test
Survey of Low-Power Testing of VLSI Circuits
IEEE Design & Test
Estimation of defect-free IDDQ in submicron circuits using switch level simulation
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Quad DCVS dynamic logic fault modeling and testing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Detection of bridging faults in logic resources of configurable FPGAs using I_DDQ
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A DFT Technique for Testing High-Speed Circuits with Arbitrarily Slow Testers
Journal of Electronic Testing: Theory and Applications
Replacing IDDQ Testing: With Variance Reduction
Journal of Electronic Testing: Theory and Applications
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing
Journal of Electronic Testing: Theory and Applications
LEAP: An Accurate Defect-Free IDDQ Estimator
ETW '00 Proceedings of the IEEE European Test Workshop
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Precise Test Generation for Resistive Bridging Faults of CMOS Combinational Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Multiple-Parameter CMOS IC Testing with Increased Sensitivity for IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A BIST Approach for Very Deep Sub-Micron (VDSM) Defects
ITC '00 Proceedings of the 2000 IEEE International Test Conference
An Empirical Study on the Effects of Test Type Ordering on
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Improving Delta-IDDQ-based test methods
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Increasing the IDDQ Test Resolution Using Current Prediction
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Improved Wafer-level Spatial Analysis for IDDQ Limit Setting
ITC '01 Proceedings of the 2001 IEEE International Test Conference
An Evaluation of Defect-Oriented Test: WELL-controlled Low Voltage Test
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Practical Built-In Current Sensor for IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Transient Power Supply Voltage (V DDT ) Analysis for Detecting IC Defects
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Intrinsic Leakage in Low Power Deep Submicron CMOS ICs
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Current Signatures: Application
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IDDQ Characterization in Submicron CMOS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
BART: A Bridging Fault Test Generator for Sequential Circuits
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Current Signatures: Application
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Design for Testability in Nanometer Technologies; Searching for Quality
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
Low Power Testing of VLSI Circuits: Problems and Solutions
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Clustering Based Techniques for IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
An Histogram Based Procedure for Current Testing of Active Defects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Transient Current Testing of 0.25 µm CMOS Devices
ITC '99 Proceedings of the 1999 IEEE International Test Conference
A DFT Technique for High Performance Circuit Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
Testing and Reliability Techniques for High-Bandwidth Embedded RAMs
Journal of Electronic Testing: Theory and Applications
On New Current Signatures and Adaptive Test Technique Combination
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
IDDQ data analysis using neighbor current ratios
Journal of Systems Architecture: the EUROMICRO Journal - Special issue: Desing and test of systems on a chip
Defect Detection Using Quiescent Signal Analysis
Journal of Electronic Testing: Theory and Applications
Graphical IDDQ signatures reduce defect level and yield loss
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Quality improvement and cost reduction using statistical outlier methods
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
CδIDDQ: improving current-based testing and diagnosis through modified test pattern generation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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