Principles of CMOS VLSI design: a systems perspective
Principles of CMOS VLSI design: a systems perspective
Discrete-time signal processing
Discrete-time signal processing
Diagnosis of leakage faults with IDDQ
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Deep Submicron CMOS Current IC Testing: Is There a Future?
IEEE Design & Test
Digital Integrated Circuit Testing using Transient Signal Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
IDDQ Test: Sensitivity Analysis of Scaling
Proceedings of the IEEE International Test Conference on Test and Design Validity
Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects
Proceedings of the IEEE International Test Conference
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A General Purpose IDDQ Measurement Circuit
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Detecting delay faults using power supply transient signal analysis
Proceedings of the IEEE International Test Conference 2001
Practical application of energy consumption ratio test
Proceedings of the IEEE International Test Conference 2001
Current signatures [VLSI circuit testing]
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Improving Delta-IDDQ-based test methods
ITC '00 Proceedings of the 2000 IEEE International Test Conference
VARIANCE REDUCTION USING WAFER PATTERNS in IddQ DATA
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Increasing the IDDQ Test Resolution Using Current Prediction
ITC '00 Proceedings of the 2000 IEEE International Test Conference
DECOUPLE: DEFECT CURRENT DETECTION IN DEEP SUBMICRON IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Clustering Based Techniques for IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
An Histogram Based Procedure for Current Testing of Active Defects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IDDQ Testing in Deep Submicron Integrated Circuits
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Transient Current Testing of 0.25 µm CMOS Devices
ITC '99 Proceedings of the 1999 IEEE International Test Conference
| Hi-index | 0.00 |
Quiescent Signal Analysis (QSA) is a novel electrical-test-based diagnostic technique that uses IDDQ measurements made at multiple chip supply pads as a means of locating shorting defects in the layout. The use of multiple supply pads ...