A fully digital controlled off-chip IDDQ measurement unit
Proceedings of the conference on Design, automation and test in Europe
Microprocessor IDDQ Testing: A Case Study
IEEE Design & Test
Plug-and-Play IDDQ Testing for Test Fixtures
IEEE Design & Test
Achieving IDDQ/ISSQ Production Testing with QuiC-Mon
IEEE Design & Test
Testing embedded-core based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Replacing IDDQ Testing: With Variance Reduction
Journal of Electronic Testing: Theory and Applications
Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Improving Delta-IDDQ-based test methods
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Experiences with Implementation of IDDQ Test for Identification and Automotive Products
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Journal of Electronic Testing: Theory and Applications
QTAG: a standard for test fixture based IDDQ/ISSQ monitors
ITC'94 Proceedings of the 1994 international conference on Test
An off-chip IDDq current measurement unit for telecommunication ASICs
ITC'94 Proceedings of the 1994 international conference on Test
Development of a class 1 QTAG monitor
ITC'94 Proceedings of the 1994 international conference on Test
A serially addressable, flexible current monitor for test fixture based IDDQ/ISSQtesting
ITC'94 Proceedings of the 1994 international conference on Test
Transactions on high-performance embedded architectures and compilers III
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