Development of a class 1 QTAG monitor

Authors:
K. Baker;A. Bratt;A. Richardson;A. Welbers
Affiliations:
Philips Research Laboratories, Eindhoven, The Netherlands;Engineering Department, Lancaster University, Laticaster, England;Engineering Department, Lancaster University, Laticaster, England;Philips Research Laboratories, Eindhoven, The Netherlands
Venue:
ITC'94 Proceedings of the 1994 international conference on Test
Year:
1994

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Abstract

This paper describes the development by the authors of an IDDQ monitor for test fixtures based on the provisional QTAG (Quality Test Action Group) standard. The monitor design project is a proof of concept study for the most demanding class 1 type current monitors defined by QTAG. In the paper the historical background to Philips' support for QTAG is outlined and why the company believes that monitors on test fixtures are currently more practical for many applications than either on-chip IDDQ monitors or ATE based measurement systems.