An Off-chip IDDQ Current Measurement Unit for Telecommunication ASICs

  • Authors:
  • Hans A. R. Manhaeve;Paul L. Wrighton;Jos van Sas;Urbain Swerts

  • Affiliations:
  • -;-;-;-

  • Venue:
  • Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
  • Year:
  • 1994

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Abstract