A fully digital controlled off-chip IDDQ measurement unit

Authors:
B. Straka;H. Manhaeve;J. Vanneuville;M. Svajda
Affiliations:
CEDO, Videnska 127, 61900 Brno, Czech Republic;KHBO, Microelectronics Department, Zeedijk 101, B-8400, Oostende, Belgium;KHBO, Microelectronics Department, Zeedijk 101, B-8400, Oostende, Belgium;Technical University of Brno, Dept. of Microelectronics, Udolni 53, 60200 Brno, Czech Republic
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
1998

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Abstract

The paper describes a new Digital controlled Off-Chip IDDQ Measurement Unit (DOCIMU), which provides reliable precision and relatively fast measurements, even with a high capacitive load, while the Device Under Test (DUT) is unaffected. The maximal resolution is 50nA and the accurate measurement range is 1mA. Unlike other IDDQ monitors, the DOCIMU copes with external interference, as it needs no analogue pin to set the IDDQ limit and the noise at the VDD is eliminated via a special S/H feature. The DOCIMU is also a testable IDDQ monitor, which is another unique feature.