A Low-Loss Built-In Current Sensor
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Dynamic Power Supply Current Testing of CMOS SRAMs
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
A fully digital controlled off-chip IDDQ measurement unit
Proceedings of the conference on Design, automation and test in Europe
A Production-Oriented Measurement Method for Fast and Exhaustive Iddq Tests
EDTC '97 Proceedings of the 1997 European conference on Design and Test
AN IDDQ SENSOR CIRCUIT FOR LOW-VOLTAGE ICS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Experiences with Implementation of IDDQ Test for Identification and Automotive Products
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Graphical IDDQ signatures reduce defect level and yield loss
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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