CCII+ Current Conveyor Based BIC Monitor for IDDQ Testing of Complex CMOS Circuits

Authors:
V. Stopjaková;H. Manhaeve
Affiliations:
Department of Microelectronics, Slovak Technical University, Ilkovicova 3, 812 19 Bratislava, Slovakia;Department of Microelectronics, KHBO, Zeedijk 101, Oostende, Belgium
Venue:
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Year:
1997

Citing 6
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Abstract

In this paper, a quiescent built-in current (BIC) monitor based on a second generation current conveyor CCII+ is presented. The monitor circuit minimises the power supply voltage degradation and provides a sensitive detection of defects that cause an elevated value of the I/sub DDQ/ current The proposed monitor offers an accurate current measurement and has a wide operation range. The CCII+ based current monitor is able to handle huge digital ASICs. Significant results summarising possibilities and limitations of the circuit are discussed as well. The design was implemented through Alcatel-Mietec 0.7 /spl mu/m CMOS technology and an evaluation of the prototype chips has been carried out. An experimental application of the proposed monitor in new analogue self-test structure was considered.