Influence of manufacturing variations in IDDQ measurements: a new test criterion
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Proceedings of the 38th annual Design Automation Conference
On effective IDDQ Testing of low-voltage CMOS circuits using leakage control techniques
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IDDQ Testing: Issues Present and Future
IEEE Design & Test
Fault Detection and Location Using IDD Waveform Analysis
IEEE Design & Test
Power supply current detectability of SRAM defects
ATS '95 Proceedings of the 4th Asian Test Symposium
Synthesis of I/sub DDQ/-testable circuits: integrating built-in current sensors
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Analysis of ISSQ/IDDQ Testing Implementation and Circuit Partitioning in CMOS Cell-Based Design
EDTC '96 Proceedings of the 1996 European conference on Design and Test
CCII+ Current Conveyor Based BIC Monitor for IDDQ Testing of Complex CMOS Circuits
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Deep Sub-Micron IDDQ Testing: Issues and Solutions
EDTC '97 Proceedings of the 1997 European conference on Design and Test
A fault diagnosis methodology for the UltraSPARC/sup TM/-I microprocessor
EDTC '97 Proceedings of the 1997 European conference on Design and Test
IDDQ Characterization in Submicron CMOS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
On Effective IDDQ Testing of Low Voltage CMOS Circuits Using Leakage Control Techniques
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
A simple built-in current sensor for IDDQ testing of CMOS data converters
Integration, the VLSI Journal
A simple built-in current sensor for IDDQ testing of CMOS data converters
Integration, the VLSI Journal
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