Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
An Off-chip IDDQ Current Measurement Unit for Telecommunication ASICs
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
CCII+ Current Conveyor Based BIC Monitor for IDDQ Testing of Complex CMOS Circuits
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Current Testing for Nanotechnologies: A Demystifying Application Perspective.
ATS '05 Proceedings of the 14th Asian Test Symposium on Asian Test Symposium
Delta-IDDQ Testing of Resistive Short Defects
ATS '06 Proceedings of the 15th Asian Test Symposium
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This paper discusses the parameters involved in making fast and reliable quiescent current (Iddq or Issq) measurements, with particular attention to the test setup and the point of measurement. For that purpose a detailed theoretical and practical study was made of the Iddq settling behaviour in function of proper measurement instrument positioning. The conclusions are that instrument positioning is a critical factor in function of achieving fast, high resolution, reliable and repeatable Iddq measurements needed to support advanced decision making strategies and Nanotechnology Iddq application, and that the use of add-on instrumentation offers the best perspectives to reach these goals.