Incorporating I_DDQ Testing with BIST forImproved Coverage: An Experimental Study
Journal of Electronic Testing: Theory and Applications
On-Line Testing for VLSI—A Compendium of Approaches
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
A fully digital controlled off-chip IDDQ measurement unit
Proceedings of the conference on Design, automation and test in Europe
Synthesis of I/sub DDQ/-testable circuits: integrating built-in current sensors
EDTC '95 Proceedings of the 1995 European conference on Design and Test
A built-in quiescent current monitor for CMOS VLSI circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Analysis of ISSQ/IDDQ Testing Implementation and Circuit Partitioning in CMOS Cell-Based Design
EDTC '96 Proceedings of the 1996 European conference on Design and Test
CCII+ Current Conveyor Based BIC Monitor for IDDQ Testing of Complex CMOS Circuits
EDTC '97 Proceedings of the 1997 European conference on Design and Test
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