A monolithic off-chip IDDQ monitor

Authors:
M. Svajda;B. Straka;H. Manhaeve
Affiliations:
Technical University of Brno, Czech Republic;CEDO, Brno, Czech Republic;KHBO, Microelectronics, Department, Oostende, Belgium
Venue:
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Year:
1997

Citing 2
Cited 0

An Off-chip IDDQ Current Measurement Unit for Telecommunication ASICs

Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Semi-digital off-chip I/sub DDQ/ monitor developments: towards a general-purpose digital current monitor

IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)

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Abstract

An integrated off-chip I/sub DDQ/ measuring unit (IOCIMU) is described in this paper. The semi-digital current monitor is designed for the use with standard automatic test equipment (ATE). Simulations of the monolithic monitor implemented in a 2-/spl mu/m BiCMOS technology show an accuracy better than 1% for currents in the range from 0 to 1 mA and a test rate up to 10 kHz.