Digital Integrated Circuit Testing using Transient Signal Analysis

IC test using the energy consumption ratio

Proceedings of the 36th annual ACM/IEEE Design Automation Conference

Deep submicron defect detection with the energy consumption ratio

ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design

Experimental Results on BIC Sensors for Transient Current Testing

Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999

Improving bus test via IDDT and boundary scan

Proceedings of the 38th annual Design Automation Conference

A novel wavelet transform based transient current analysis for fault detection and localization

Proceedings of the 39th annual Design Automation Conference

Crosstalk fault detection by dynamic Idd

Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design

Process-tolerant test with energy consumption ratio

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Replacing IDDQ Testing: With Variance Reduction

Journal of Electronic Testing: Theory and Applications

An Analysis of the Delay Defect Detection Capability of the ECR Test Method

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Transient Power Supply Voltage (V DDT ) Analysis for Detecting IC Defects

ITC '97 Proceedings of the 1997 IEEE International Test Conference

IDD Pulse Response Testing Applied to Complex CMOS ICs

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data

ITC '97 Proceedings of the 1997 IEEE International Test Conference

IDDT: fundamentals and test generation

Journal of Computer Science and Technology

Statistical Threshold Formulation For Dynamic Idd Test

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Defect Detection using Power Supply Transient Signal Analysis

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Transient Current Testing of 0.25 µm CMOS Devices

ITC '99 Proceedings of the 1999 IEEE International Test Conference

On Faster IDDQ Measurements

Journal of Electronic Testing: Theory and Applications

On New Current Signatures and Adaptive Test Technique Combination

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

IDDX-based test methods: A survey

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Scaling of iDDT Test Methods for Random Logic Circuits

Journal of Electronic Testing: Theory and Applications