Neural network PC tools: a practical guide
Neural network PC tools: a practical guide
Transient power supply current monitoring—a new test method for CMOS VLSI circuits
Journal of Electronic Testing: Theory and Applications
Defect Classes - An Overdue Paradigm for CMOS IC
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Transient Power Supply Current Testing of Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Digital Integrated Circuit Testing using Transient Signal Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
iDD Pulse Response Testing of Analog and Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
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This paper presents test results for detecting defects incomplex ICs by analyzing the changes observed in thepower-on transient power supply currents for the IC. Thistest technique, called iDD Pulse Response Testingsimultaneously pulses the VDD and VSS power supply railswhile applying a fixed midrange bias voltage to all inputs tothe DUT. The resulting power on transient currentsignature is then analyzed for the presence of abnormalbehavior. Two methods of analyzing the transient currentsignature waveform are compared for two types of complexCMOS ICs. The type of defects detected by the test as well asapplications of this method to production test are discussed.