Transient Power Supply Current Testing of Digital CMOS Circuits

IDDT Testing versus IDDQ Testing

Journal of Electronic Testing: Theory and Applications

Dynamic Power Supply Current Testing of CMOS SRAMs

Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98

CMOS open defect detection by supply current test

Proceedings of the conference on Design, automation and test in Europe

Improving bus test via IDDT and boundary scan

Proceedings of the 38th annual Design Automation Conference

Fault Detection and Location Using IDD Waveform Analysis

IEEE Design & Test

Performance Comparison of VLV, ULV, and ECR Tests

Journal of Electronic Testing: Theory and Applications

Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Power Supply Transient Signal Integration Circuit

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Detecting Delay Faults using Power Supply Transient Signal Analysis

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Practical Application of Energy Consumption Ratio Test

ITC '01 Proceedings of the 2001 IEEE International Test Conference

IDD Pulse Response Testing Applied to Complex CMOS ICs

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data

ITC '97 Proceedings of the 1997 IEEE International Test Conference

IDDT: fundamentals and test generation

Journal of Computer Science and Technology

Defect Detection using Power Supply Transient Signal Analysis

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Transient Current Testing of 0.25 µm CMOS Devices

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Fault Simulation Model for i{DDT} Testing: An Investigation

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

IDDX-based test methods: A survey

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Scaling of iDDT Test Methods for Random Logic Circuits

Journal of Electronic Testing: Theory and Applications

Defect Simulation Methodology for iDDT Testing

Journal of Electronic Testing: Theory and Applications

A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines

Journal of Electronic Testing: Theory and Applications