ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Transient Power Supply Current Testing of Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
iDD Pulse Response Testing of Analog and Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Monitoring power dissipation for fault detection
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
An Analysis of the Delay Defect Detection Capability of the ECR Test Method
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Predicting Device Performance From Pass/Fail Transient Signal Analysis Data
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Defect Detection using Power Supply Transient Signal Analysis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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A delay-fault testing strategy based on the analysis ofpower supply transient signals is presented. The method isan extension to a Go/No-Go device testing method calledTransient Signal Analysis (TSA) [1]. TSA detects defectsthrough the analysis of a set of power supply transientwaveforms in the time or frequency domain, e.g., Fourierphase components. A recent extension to TSA demonstrateda correlation between the VDDT Fourier phasecomponents and path delays in defect-free devices [2]. Themethod proposed here is able to detect increases in delaydue to resistive shorting and open defects using a similartechnique. In particular, simulation results show that adelay defective device can be distinguished from adefect-free device through an anomaly in the Fourier phasecorrelation profile of the device.