Fault detection and input stimulus determination for the testing of analog integrated circuits based on power-supply current monitoring

Authors:
Georges Gielen;Zhihua Wang;Willy Sansen
Affiliations:
Department of Electrical Engineering, Katholieke Universiteit Leuven, Kardinaal Mercierlaan 94, 3001 Heverlee, Belgium;Department of Electrical Engineering, Katholieke Universiteit Leuven, Kardinaal Mercierlaan 94, 3001 Heverlee, Belgium and Electronic Engineering Department of Tsinghua University, P. R. China;Department of Electrical Engineering, Katholieke Universiteit Leuven, Kardinaal Mercierlaan 94, 3001 Heverlee, Belgium
Venue:
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Year:
1994

Citing 1
Cited 13

Test Generation for Current Testing (CMOS ICs)

IEEE Design & Test

Dynamic test signal design for analog ICs

ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Design of robust test criteria in analog testing

Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Monitoring Power Dissipation for Fault Detection

Journal of Electronic Testing: Theory and Applications
Analog test design with IDD measurements for the detection of parametric and catastrophic faults

Proceedings of the conference on Design, automation and test in Europe
Real-Time Current Testing for A/D Converters

IEEE Design & Test
Automated test pattern generation for analog integrated circuits

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Detecting Delay Faults using Power Supply Transient Signal Analysis

ITC '01 Proceedings of the 2001 IEEE International Test Conference
Fault Simulation Model for i{DDT} Testing: An Investigation

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks

Journal of Electronic Testing: Theory and Applications
Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current

Journal of Electronic Testing: Theory and Applications
Defect Simulation Methodology for iDDT Testing

Journal of Electronic Testing: Theory and Applications
Analytical modelling of parameter fluctuations with applications to analogue VLSI circuits and systems

ICOSSSE'05 Proceedings of the 4th WSEAS/IASME international conference on System science and simulation in engineering

Quantified Score

Hi-index	0.00

Visualization

Abstract

A new method for the testing and fault detection of analog integrated circuits is presented. Time-domain testing followed by spectral analysis of the power-supply current is used to detect both DC and AC faults. Spectral analysis is applied since the tolerances on the circuit parameters make a direct comparison of waveforms impossible. For the fault detection a probabilistic decision rule is proposed based on a multivariate statistical analysis. Since no extra testing pin is needed and the on-line calculation effort is small, the method can be used for wafer-probe testing as well as final production testing. In addition, a methodology for the selection of the input stimulus is presented that improves the test-ability. Examples demonstrate the efficiency and the effectiveness of the algorithms.