Analytical fault modeling and static test generation for analog ICs
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Test Vector Generation for Linear Analog Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Testability analysis and multi-frequency ATPG for analog circuits and systems
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Minimal length diagnostic tests for analog circuits using test history
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
Robust optimization based backtrace method for analog circuits
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Test generation based diagnosis of device parameters for analog circuits
Proceedings of the conference on Design, automation and test in Europe
Proceedings of the conference on Design, automation and test in Europe
Partial simulation-driven ATPG for detection and diagnosis of faults in analog circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Analog Testing with Time Response Parameters
IEEE Design & Test
Hierarchical ATPG for Analog Circuits and Systems
IEEE Design & Test
Automated test pattern generation for analog integrated circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
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In this paper we present an approach to construct dynamic test signals for analog circuits. Using the integral measure for characterizing time-domain signals, we extend the minmax formulation of the static test problem to the dynamic case. A sub-optimal solution strategy, similar to dynamic programming methods is used to construct the test waveforms. The approach presented here may be used to construct input signals for an on-chip test scheme or for the selection of an external stimulus applied through an arbitrary waveform generator.