Multiple fault analog circuit testing by sensitivity analysis
Journal of Electronic Testing: Theory and Applications - Joint special issue on analog and mixed-signal testing
A new built-in self-test approach for digital-to-analog and analog-to-digital converters
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Pseudo-random testing and signature analysis for mixed-signal circuits
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Dynamic test signal design for analog ICs
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
DC Built-In Self-Test for Linear Analog Circuits
IEEE Design & Test
A Signature Analyzer for Analog and Mixed-signal Circuits
ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
Specification-Driven Test Design for Analog Circuits
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
Proceedings of the IEEE International Test Conference
HABIST: Histogram-Based Analog Built-In Self-Test
Proceedings of the IEEE International Test Conference
A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Test Vector Generation for Linear Analog Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Oscillation-test strategy for analog and mixed-signal integrated circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Implicit functional testing for analog circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
A Design for Testability Scheme for CMOS LC-Tank Voltage Controlled Oscillators
Journal of Electronic Testing: Theory and Applications
An On-Chip Spectrum Analyzer for Analog Built-In Testing
Journal of Electronic Testing: Theory and Applications
A DFT Approach for Testing Embedded Systems Using DC Sensors
IEEE Design & Test
Digital-Compatible Testing Scheme for Operational Amplifier
Journal of Electronic Testing: Theory and Applications
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For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits