Built-in self-test and fault diagnosis of fully differential analogue circuits
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
A new built-in self-test approach for digital-to-analog and analog-to-digital converters
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Pseudo-random testing and signature analysis for mixed-signal circuits
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Design based analog testing by Characteristic Observation Inference
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
DC Built-In Self-Test for Linear Analog Circuits
IEEE Design & Test
A D&T Special Report: P1149.4 Mixed-Signal Test Bus
IEEE Design & Test
A Signature Analyzer for Analog and Mixed-signal Circuits
ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Practical Considerations for Mixed-Signal Test Bus
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Design for Testability of a Modular, Mixed Signal Family of VLSI Devices
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Optimization of analog IC test structures
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Oscillation-test strategy for analog and mixed-signal integrated circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Implicit functional testing for analog circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Fault Models and Test Generation for OpAmp Circuits—The FFM
Journal of Electronic Testing: Theory and Applications
A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
A Transition Based BIST Approach for Passive Analog Circuits
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
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The advent of new electronic packaging technologies has fueled the drive towards rapid integration of digital and analog functions particularly in portable computing and communications applications. This integration of digital and analog circuits into closely coupled mixed-signal circuits has brought with it, many challenges in the design and test areas. The problem in testing mixed-signal circuits arises from the simple fact that digital and analog fault models are inherently different. Moreover, while digital fault models are well understood (i.e. stuck-at faults), analog fault models are not quite as well-defined and mature. Another key problem stems from the fact that analog signals are inherently imprecise. Hence, with any analog measurement one must associate an accuracy of measurement. For large systems, it therefore becomes necessary to incorporate design for testability and built-in self-test (BIST) features in order to achieve high coverage of digital and analog faults. Also, with use of these features, fault simulation and test generation becomes easier. In the following paper, the authors discuss recent work in the area of design for testability and BIST.